Opis

• Tytuł:
  A Method of RTS Noise Identification in Noise Signals of Semiconductor Devices in the Time Domain
• Twórca:
  Stawarz-Graczyk, Barbara;
  Dokupil, Dariusz;
  Flisikowski, Paweł
• Opis:
  Editorial Board Editor-in-Chief Ryszard SZPLET Military University of Technology, Poland e-mail: ryszard.szplet@wat.edu.pl Vice Editor-in-Chief Paweł KWIATKOWSKI Military University of Technology, Poland e-mail: pawel.kwiatkowski@wat.edu.pl Technical Editor and Webmaster Dominik SONDEJ Military University of Technology, Poland e-mail: dominik.sondej@wat.edu.pl Language Editor Andrzej ŁUKASZEWICZ Military University of Technology, Poland e-mail: andrzej.lukaszewicz@wat.edu.pl International Programme Committee Andrzej ZAJĄC, Chairman Military University of Technology, Poland Bruno ANDO University of Catania, Italy Martin BURGHOFF Physikalisch-Technische Bundesanstalt, Germany Marcantonio CATELANI University of Florence, Italy Numan DURAKBASA Vienna University of Technology, Austria Janusz GAJDA AGH University of Science and Technology, Poland Domenico GRIMALDI University of Calabria, Italy Laszlo KISH Texas A&M University, USA Juha KOSTAMOVAARA University of Oulu, Finland Eduard LLOBET Universitat Rovira i Virgili, Tarragona, Spain Alex MASON Liverpool John Moores University, The United Kingdom Subhas MUKHOPADHYAY Massey University, Palmerston North, New Zealand Janusz MROCZKA Wroclaw University of Science and Technology, Poland Antoni ROGALSKI Military University of Technology, Poland Wiesław WOLIŃSKI Warsaw University of Technology, Poland Associate Editors Sławomir CIĘSZCZYK Lublin University of Technology, Poland e-mail: s.cieszczyk@pollub.pl Albin CZUBLA Central Office of Measure, Poland e-mail: albin.czubla@gum.gov.pl Vladimir DIMCHEV Ss. Cyril and Methodius University, Macedonia e-mail: vladim@feit.ukim.edu.mk Krzysztof DUDA University of Science and Technology, Poland e-mail: kduda@agh.edu.pl Agnieszka IWAN Military University of Land Forces, Poland e-mail: agnieszka.iwan@awl.edu.pl Ireneusz JABŁOŃSKI Wrocław University of Science and Technology, Poland e-mail: ireneusz.jablonski@pwr.wroc.pl Jacek JAKUBOWSKI Military University of Technology, Poland e-mail: jacek.jakubowski@wat.edu.pl Jussi-Pekka JANSSON University of Oulu, Finland e-mail: jussi.jansson@oulu.fi Mieczysław JESSA Poznan University of Technology, Poland e-mail: mieczyslaw.jessa@put.poznan.pl Piotr KANIEWSKI Military University of Technology, Poland e-mail: piotr.kaniewski@wat.edu.pl Piotr KISAŁA Lublin University of Technology, Poland e-mail: p.kisala@pollub.pl Manoj KUMAR Jaypee Institute of Information Technology, Uttar Pradesh, India e-mail: my.hunn.manoj@gmail.com Grzegorz LENTKA Gdańsk University of Technology, Poland e-mail: lentka@eti.pg.edu.pl Czesław ŁUKIANOWICZ Koszalin University of Technology, Poland e-mail: czeslaw.lukianowicz@tu.koszalin.pl Rosario MORELLO University Mediterranean of Reggio Calabria, Italy e-mail: rosario.morello@unirc.it Petr SEDLAK Brno University of Technology, Brno, Czech Republic e-mail: sedlakp@feec.vutbr.cz Tadeusz SONDEJ Military University of Technology, Poland e-mail: tadeusz.sondej@wat.edu.pl Mirosław SZMAJDA Opole University of Technology, Poland e-mail: m.szmajda@po.edu.pl Michał STRZELECKI Lodz University of Technology, Poland e-mail: michal.strzelecki@p.lodz.pl Grzegorz ŚWIRNIAK Wrocław University of Technology, Poland e-mail: grzegorz.swirniak@pwr.wroc.pl Michał WIECZOROWSKI Poznan University of Technology, Poland e-mail: jmichal.wieczorowski@put.poznan.pl Jacek WOJTAS Military University of Technology, Poland e-mail: jacek.wojtas@wat.edu.pl
• Dostępność obiektu:
  Dostęp otwarty
• Prawa:
  Metrology and Measurement Systems jest czasopismem wydawanym w wolnym dostępie na licencji CC BY-NC-ND 4.0. <a href=" https://creativecommons.org/licenses/by-nc-nd/4.0/"> https://creativecommons.org/licenses/by-nc-nd/4.0/</a></p>Metrology and Measurement Systems is an open access journal with all content available with no charge in full text version. The journal content is available under the licencse CC BY-NC-ND 4.0 <a href=" https://creativecommons.org/licenses/by-nc-nd/4.0/"> https://creativecommons.org/licenses/by-nc-nd/4.0/</a>.
• Data:
  2010
• Typ:
  Artykuły / Articles
• Źródło:
  Metrology and Measurement Systems; 2010; No 1
• Wydawca:
  Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation
• Temat i słowa kluczowe:
  RTS noise;
  Gram-Charlier series;
  semiconductor devices;
  optocouplers;
  Nauki Techniczne
• Identyfikator:
  ISSN 2080-9050, e-ISSN 2300-1941
• Dostawca danych:
  Czasopisma PAN
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  sprawdź warunki licencji
• Rodzaj zawartości:
  obrazy