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Characterization of the different energy-gap multilayer structures using near field microscopy

Object's details: Characterization of the different energy-gap multilayer structures using near field microscopy

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Provider:Dolnośląska Biblioteka Cyfrowa

Description

Title:
Characterization of the different energy-gap multilayer structures using near field microscopy
Creator:
Sikora, Andrzej;
Szeloch, Roman;
Prociów, Eugeniusz
Contributor:
Gaj, Miron. Redakcja;
Urbańczyk, Wacław. Redakcja
Description:
Optica Applicata, Vol. 39, 2009, nr 4, s. 943-950
Object availability:
free access
Rights:
Wszystkie prawa zastrzeżone (Copyright);
Dla wszystkich w zakresie dozwolonego użytku
Date:
2009.12.31;
2009
Type:
artykuł
Language:
English
Source:
<sygn. PWr A3481II>;
http://aleph.bg.pwr.wroc.pl/F/?func=find-b&request=000122307+&find_code=SYS&adjacent=N&local_base=TUR&x=64&y=13&filter_code_1=WLN&filter_request_1=&filter_code_2=WYR&filter_request_2=&filter_code_3=WYR&filter_request_3=&filter_code_4=WFT&filter_request_4=&filter_code_5=WSB&filter_request_5= ;http://opticaapplicata.pwr.edu.pl
Publisher:
Oficyna Wydawnicza Politechniki Wrocławskiej
Relation:
Optica Applicata;
Optica Applicata, Vol. 39, 2009;
Optica Applicata, Vol. 39, 2009, nr 4;
Politechnika Wrocławska. Wydział Podstawowych Problemów Techniki
Subject:
optyka;
thin films;
contact phenomena;
near field microscopy;
AFM;
silicon carbide
Data provider:
Dolnośląska Biblioteka Cyfrowa

Can I use it?:
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