Object's details: The Analysis Of Accuracy Of Selected Methods Of Measuring The Thermal Resistance Of IGBTs

Provider:Czasopisma PAN

Description

Title:
The Analysis Of Accuracy Of Selected Methods Of Measuring The Thermal Resistance Of IGBTs
Creator:
Górecki, Krzysztof;
Górecki, Paweł
Description:
Metrology and Measurement Systems is an international journal, peer-reviewed, quarterly-published, launched in 1988. Since 2001 it has appeared in English. The journal is published both in the paper and electronic form on the Electronic Library platform, Polish Academy of Sciences. The Journal is indexed in Journal Citation Reports and Web of Science Master Journal List (Clarivate Analytics formerly Thomson Reuters), INSPEC, Scopus, Index Copernicus, Google Scholar, CSA Technology Research, High Tech Research Database, Solid State & Superconductivity. Impact Factor for 2022*: 1.0 Contributions are invited on all aspects of research, development and applications of the measurement science and associated technology. The list of topics covered includes: theory, general principles and applications of measurement; measurement of physical, chemical and biological quantities; medical measurements; sensors and transducers; measurement data acquisition; measurement signal transmission; processing and data analysis; measurement systems and embedded systems; design, manufacture and evaluation of measurement instrumentation. The average publication cycle is 6 months. *According to Journal Citation Reports;
Editorial Board Editor-in-Chief Ryszard SZPLET Military University of Technology, Poland e-mail: ryszard.szplet@wat.edu.pl Vice Editor-in-Chief Paweł KWIATKOWSKI Military University of Technology, Poland e-mail: pawel.kwiatkowski@wat.edu.pl Technical Editor and Webmaster Dominik SONDEJ Military University of Technology, Poland e-mail: dominik.sondej@wat.edu.pl Language Editor Andrzej ŁUKASZEWICZ Military University of Technology, Poland e-mail: andrzej.lukaszewicz@wat.edu.pl International Programme Committee Andrzej ZAJĄC, Chairman Military University of Technology, Poland Bruno ANDO University of Catania, Italy Martin BURGHOFF Physikalisch-Technische Bundesanstalt, Germany Marcantonio CATELANI University of Florence, Italy Numan DURAKBASA Vienna University of Technology, Austria Janusz GAJDA AGH University of Science and Technology, Poland Domenico GRIMALDI University of Calabria, Italy Laszlo KISH Texas A&M University, USA Juha KOSTAMOVAARA University of Oulu, Finland Eduard LLOBET Universitat Rovira i Virgili, Tarragona, Spain Alex MASON Liverpool John Moores University, The United Kingdom Subhas MUKHOPADHYAY Massey University, Palmerston North, New Zealand Janusz MROCZKA Wroclaw University of Science and Technology, Poland Antoni ROGALSKI Military University of Technology, Poland Wiesław WOLIŃSKI Warsaw University of Technology, Poland Associate Editors Sławomir CIĘSZCZYK Lublin University of Technology, Poland e-mail: s.cieszczyk@pollub.pl Albin CZUBLA Central Office of Measure, Poland e-mail: albin.czubla@gum.gov.pl Vladimir DIMCHEV Ss. Cyril and Methodius University, Macedonia e-mail: vladim@feit.ukim.edu.mk Krzysztof DUDA University of Science and Technology, Poland e-mail: kduda@agh.edu.pl Agnieszka IWAN Military University of Land Forces, Poland e-mail: agnieszka.iwan@awl.edu.pl Ireneusz JABŁOŃSKI Wrocław University of Science and Technology, Poland e-mail: ireneusz.jablonski@pwr.wroc.pl Jacek JAKUBOWSKI Military University of Technology, Poland e-mail: jacek.jakubowski@wat.edu.pl Jussi-Pekka JANSSON University of Oulu, Finland e-mail: jussi.jansson@oulu.fi Mieczysław JESSA Poznan University of Technology, Poland e-mail: mieczyslaw.jessa@put.poznan.pl Piotr KANIEWSKI Military University of Technology, Poland e-mail: piotr.kaniewski@wat.edu.pl Piotr KISAŁA Lublin University of Technology, Poland e-mail: p.kisala@pollub.pl Manoj KUMAR Jaypee Institute of Information Technology, Uttar Pradesh, India e-mail: my.hunn.manoj@gmail.com Grzegorz LENTKA Gdańsk University of Technology, Poland e-mail: lentka@eti.pg.edu.pl Czesław ŁUKIANOWICZ Koszalin University of Technology, Poland e-mail: czeslaw.lukianowicz@tu.koszalin.pl Rosario MORELLO University Mediterranean of Reggio Calabria, Italy e-mail: rosario.morello@unirc.it Petr SEDLAK Brno University of Technology, Brno, Czech Republic e-mail: sedlakp@feec.vutbr.cz Tadeusz SONDEJ Military University of Technology, Poland e-mail: tadeusz.sondej@wat.edu.pl Mirosław SZMAJDA Opole University of Technology, Poland e-mail: m.szmajda@po.edu.pl Michał STRZELECKI Lodz University of Technology, Poland e-mail: michal.strzelecki@p.lodz.pl Grzegorz ŚWIRNIAK Wrocław University of Technology, Poland e-mail: grzegorz.swirniak@pwr.wroc.pl Michał WIECZOROWSKI Poznan University of Technology, Poland e-mail: jmichal.wieczorowski@put.poznan.pl Jacek WOJTAS Military University of Technology, Poland e-mail: jacek.wojtas@wat.edu.pl
Object availability:
free access
Rights:
Metrology and Measurement Systems jest czasopismem wydawanym w wolnym dostępie na licencji CC BY-NC-ND 4.0. <a href=" https://creativecommons.org/licenses/by-nc-nd/4.0/"> https://creativecommons.org/licenses/by-nc-nd/4.0/</a></p>Metrology and Measurement Systems is an open access journal with all content available with no charge in full text version. The journal content is available under the licencse CC BY-NC-ND 4.0 <a href=" https://creativecommons.org/licenses/by-nc-nd/4.0/"> https://creativecommons.org/licenses/by-nc-nd/4.0/</a>.
Date:
2015
Type:
Artykuły / Articles
Source:
Metrology and Measurement Systems; 2015; vol. 22; No 3; 455-464
Coverage:
455-464
Publisher:
Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation
Subject:
IGBT;
thermal resistance;
measurements;
transistor;
semiconductor devices;
Nauki Techniczne
Identifier:
ISSN 2080-9050, e-ISSN 2300-1941
Data provider:
Czasopisma PAN

Similar objects

Influence of Thermal Phenomena on dc Characteristics of the IGBT

Creator:Górecki, Paweł | Górecki, Krzysztof

Date:2018.03.30

Type:image

The Analysis Of Accuracy Of Selected Methods Of Measuring The Thermal Resistance Of IGBTs

Creator:Górecki, Krzysztof | Górecki, Paweł

Date:2015

Type:image

Compact Thermal Models of Semiconductor Devices – a Review

Creator:Górecki, Krzysztof | Zarębski, Janusz | Górecki, Paweł | Ptak, Przemysław

Date:2019.06.13

Type:image

Sprawowanie wymiaru sprawiedliwości przez sądy administracyjne jako gwarancja przestrzegania praw człowieka

Creator:Górecki, Paweł

Date:2010-01-01-2010-12-31 | 2010

Type:image

Recenzja rozprawy doktorskiej mgra inż. Marka Kokota pt. Wyznaczanie zbiorów podsłów sekwencji nukleotydowych w danych z sekwencjonowania genomów

Creator:Górecki, Paweł

Date:2020.12.31 | 2020

Type:other

Application of the Averaged Model of the Diode transistorSwitch for Modelling Characteristics of a Boost Converter with an IGBT

Creator:Górecki, Paweł

Date:2020.09.17

Type:image

Recenzja rozprawy doktorskiej mgra inż. Macieja Długosza pt. Korekcja danych z sekwencjonowania genomów

Creator:Górecki, Paweł

Date:2023.12.31 | 2023

Type:other

Recenzja rozprawy doktorskiej mgra inż. Marcina Waleckiego pt. Zastosowanie wielowejściowych wzmacniaczy operacyjnych do realizacji wybranych układów w cyfrowych systemach logiki wielowartościowej

Creator:Górecki, Krzysztof

Date:2016.12.31 | 2016

Type:other

Federacja Bibliotek Cyfrowych

Object's details: The Analysis Of Accuracy Of Selected Methods Of Measuring The Thermal Resistance Of IGBTs

Description

Similar objects