Description

• Title:
  Vision-based Online Defect Detection of Polymeric Film via Structural Quality Metrics
• Creator:
  Rawashedeh, Nathir;
  Hazaveh, Paniz;
  Altarazi, Safwan
• Contributor:
  Rawashedeh, Nathir : Michigan Technological University, College of Computing, USA;
  Rawashedeh, Nathir : German Jordanian University, School of Applied Technical Sciences, Jordan;
  Hazaveh, Paniz : Michigan Technological University, College of Computing, USA;
  Altarazi, Safwan : German Jordanian University, School of Applied Technical Sciences, Jordan
• Description:
  Editor-in-Chief A.Hamrol, Poznan University of Technology, Poland Deputy Editor in Chief J.O. Paliszkiewicz, Warsaw University of Life Sciences, Poland Editors Production and Manufacturing J. Takala, University of Vaasa, Finland Project and Production Management K. Phusavat, Kasetsart University, Thailand Quality and sustainability J. J. Dahlgaard, Linköping University, Sweden Innovation and Development Z. Banaszak, Koszalin University of Technology, Poland Editorial Advisory Board W. Bojar, University of Technology and Life Sciences, Poland S. Cavalieri, University of Bergamo, Italy A. Dolgui, Ecole des Mines de Saint-Etienne, France S. Gagnon, University of Quebec, Montreal, Canada M. Gallo,University of Napoli Federico II, Italy J. Gawlik,Tadeusz Kosciuszko Cracow University of Technology, Poland M. Gregor, University of Zlina, Slovakia H.-M. Hanisch, Martin Luther University of Halle-Wittenberg, Germany W. Karwowski, University of Central Florida, USA S. Klos, University of Zielona Gora, Poland T. Koch, Wroclaw University of Technology, Poland A. Koohang, Middle Georgia State University, USA S. Legutko, Poznan University of Technology, Poland J. Liebowitz, University of Maryland University College, USA B. Lin, The Louisiana State University, USA J. Matuszek, University of Bielsko-Biala, Poland Y. Merkuryev, Technical University, Latvia J. Nazarko, Bialystok University of Technology, Poland P. Nielsen, Aalborg University, Denmark S. Y. Nof, Purdue University, USA B. W. Oppenheim, Loyola Marymount University, USA R Roy, Cranfield University, Great Britain T. Sawik, AGH University of Science and Technology, Poland J. Senkara, Warsaw University of Technology, Poland J. Sęp, Rzeszów University of Technology, Poland M. Skibniewski, University of Maryland, USA A. W. Skorek, Universite du Quebec a Trois-Rivieres, Canada A. V. Smirnov, Institute for Informatics and Automation of the Russian Academy of Sciences, Russia M. S. G. Tsuzuki, The University of Sao Paulo, Brasil S. Yen-Liang Yin, National Taiwan University, Taiwan Beijing, China M. B. Zaremba, University of Quebec, Canada;
  The non-commercial use of the article will be governed by the Creative Commons Attribution license as currently displayed on https://creativecommons.org/licenses/by/4.0
• Object availability:
  free access
• Rights:
  <br><b><i> Management and Production Engineering Review</i></b> is an open access journal with all content available with no charge in full text version. The journal content is available under the license CC BY 4.0 International <a href=" https://creativecommons.org/licenses/by/4.0/">https://creativecommons.org/licenses/by/4.0/</a>.
• Date:
  2023.03.31
• Type:
  Article
• Coverage:
  61-71
• Publisher:
  Production Engineering Committee of the Polish Academy of Sciences, Polish Association for Production Management
• Subject:
  Industrial inspection;
  Quality control;
  defect detection;
  Polymer film;
  Vision
• Identifier:
  ISSN 2080-8208;
  eISSN 2082-1344
• Data provider:
  Czasopisma PAN
• Can I use it?:
  check license
• Type:
  image