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Ellipsometry in optical studies of thin films conducted at the Institute of Physics of Wroclaw University of Technology

Object's details: Ellipsometry in optical studies of thin films conducted at the Institute of Physics of Wroclaw University of Technology

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Provider:Dolnośląska Biblioteka Cyfrowa

Description

Title:
Ellipsometry in optical studies of thin films conducted at the Institute of Physics of Wroclaw University of Technology
Creator:
Żukowska, Krystyna;
Oleszkiewicz, Ewa
Contributor:
Gaj, Miron. Redakcja;
Wilk, Ireneusz. Redakcja
Description:
Optica Applicata, Vol. 31, 2001, nr 1, s. 35-51
Object availability:
free access
Rights:
Wszystkie prawa zastrzeżone (Copyright);
Dla wszystkich w zakresie dozwolonego użytku
Date:
2001.12.31;
2001
Type:
artykuł
Language:
English
Source:
<sygn. PWr A3481II>;
http://aleph.bg.pwr.wroc.pl/F/?func=find-b&request=000122307+&find_code=SYS&adjacent=N&local_base=TUR&x=64&y=13&filter_code_1=WLN&filter_request_1=&filter_code_2=WYR&filter_request_2=&filter_code_3=WYR&filter_request_3=&filter_code_4=WFT&filter_request_4=&filter_code_5=WSB&filter_request_5= ;http://opticaapplicata.pwr.edu.pl
Format:
application/pdf
Publisher:
Oficyna Wydawnicza Politechniki Wrocławskiej
Relation:
Optica Applicata;
Optica Applicata, Vol. 31, 2001;
Optica Applicata, Vol. 31, 2001, nr 1;
Politechnika Wrocławska. Wydział Podstawowych Problemów Techniki
Subject:
optyka
Data provider:
Dolnośląska Biblioteka Cyfrowa

Can I use it?:
seek permission
Type:
image

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