Object's details: Letter to the Editor: An algorithm for determining the refractive index and thickness of thin dielectric layers on an absorbing substrate on the basis of ellipsometric measurements

Provider:Dolnośląska Biblioteka Cyfrowa

Description

Title:
Letter to the Editor: An algorithm for determining the refractive index and thickness of thin dielectric layers on an absorbing substrate on the basis of ellipsometric measurements
Creator:
Idczak, Elżbieta;
Oleszkiewicz, Ewa;
Żukowska, Krystyna
Contributor:
Gaj, Miron. Redakcja
Description:
Optica Applicata is an international journal, published in a non-periodical form in the years 1971-1973 and quarterly since 1973. From the beginning of the year 2008, Optica Applicata is an Open Access journal available online via the Internet, with free access to the full text of articles serving the best interests of the scientific community. The journal is abstracted and indexed in: Chemical Abstracts, Compendex, Current Contents, Inspec, Referativnyj Zhurnal, SCI Expanded, Scopus, Ulrich’s Periodicals Directory;
http://opticaapplicata.pwr.edu.pl ;
Optica Applicata, Vol. 9, 1979, nr 1, s. 47-51
Object availability:
free access
Rights:
Wszystkie prawa zastrzeżone (Copyright);
Dla wszystkich w zakresie dozwolonego użytku
Date:
1979.12.31;
1979
Type:
artykuł
Language:
English
Source:
<sygn. PWr A3481II>;
http://aleph.bg.pwr.wroc.pl/F/?func=find-b&request=000122307+&find_code=SYS&adjacent=N&local_base=TUR&x=64&y=13&filter_code_1=WLN&filter_request_1=&filter_code_2=WYR&filter_request_2=&filter_code_3=WYR&filter_request_3=&filter_code_4=WFT&filter_request_4=&filter_code_5=WSB&filter_request_5= ;http://opticaapplicata.pwr.edu.pl
Format:
application/pdf
Publisher:
Oficyna Wydawnicza Politechniki Wrocławskiej
Relation:
Optica Applicata;
Optica Applicata, Vol. 9, 1979;
Optica Applicata, Vol. 9, 1979, nr 1;
Politechnika Wrocławska. Wydział Podstawowych Problemów Techniki
Subject:
optyka
Data provider:
Dolnośląska Biblioteka Cyfrowa

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Object's details: Letter to the Editor: An algorithm for determining the refractive index and thickness of thin dielectric layers on an absorbing substrate on the basis of ellipsometric measurements

Description

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